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Electronic instrumentation

By: Material type: TextSeries: Prentice-Hall series in electronic technologyPublication details: Englewood Cliffs, N.J., Prentice Hall [1971]Edition: 2d edDescription: xx, 536 p. illus. 25 cmISBN:
  • 0132516454
  • 9780132516457
Subject(s): DDC classification:
  • 621.381548
LOC classification:
  • TK7878.4 .P65 1971
Contents:
Chapter 1: General instrumentation -- Chapter 2: The basic meter in direct-current measurements -- Chapter 3: The basic meter in alternating-current measurements -- Chapter 4: Comparison measurement methods -- Chapter 5: Alternating-current bridge and impedance measurement methods -- Chapter 6: Electron devices -- Chapter 7: Electronic voltmeters -- Chapter 8: Recording systems -- Chapter 9: Transducers -- Chapter 10: The cathode-ray oscilloscope -- Chapter 11: Signal generators -- Chapter 12: Component test methods -- Chapter 13: Integrated circuits -- Chapter 14: Untuned-amplifier test methods -- Chapter 15: Radio-frequency test methods -- Chapter 16: Nuclear-radiation detection instruments -- Chapter 17: Digital instruments -- Chapter 18: Analog computers -- Chapter 19: Specialized instrument applications.
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Holdings
Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Books Centeral Library Second Floor - Engineering & Architecture 621.381548 K.H.E 1971 (Browse shelf(Opens below)) Available 3506

Bibliography: p. 512-18.

Chapter 1: General instrumentation -- Chapter 2: The basic meter in direct-current measurements -- Chapter 3: The basic meter in alternating-current measurements -- Chapter 4: Comparison measurement methods -- Chapter 5: Alternating-current bridge and impedance measurement methods -- Chapter 6: Electron devices -- Chapter 7: Electronic voltmeters -- Chapter 8: Recording systems -- Chapter 9: Transducers -- Chapter 10: The cathode-ray oscilloscope -- Chapter 11: Signal generators -- Chapter 12: Component test methods -- Chapter 13: Integrated circuits -- Chapter 14: Untuned-amplifier test methods -- Chapter 15: Radio-frequency test methods -- Chapter 16: Nuclear-radiation detection instruments -- Chapter 17: Digital instruments -- Chapter 18: Analog computers -- Chapter 19: Specialized instrument applications.

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