000 01207pam a2200289 a 4500
999 _c2763
_d2763
001 3904216
005 20170123122752.0
008 910410s1991 si a 000 0 eng
010 _a 91003700
020 _a9810202822
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTK7874
_b.J34 1991
082 0 0 _a621.39/5
_220
100 1 _aJakubowski, Andrzej.
245 1 0 _aDiagnostic measurements in LSI/VLSI integrated circuits production /
_cAndrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki.
260 _aSingapore ;
_aTeaneck, NJ :
_bWorld Scientific,
_cc1991.
300 _axv, 356 p. :
_bill. ;
_c23 cm.
440 0 _aAdvanced series in electrical and computer engineering ;
_vvol. 7
504 _aIncludes bibliographical references.
650 0 _aIntegrated circuits
_xVery large scale integration
_xDesign and construction.
650 0 _aIntegrated circuits
_xVery large scale integration
_xTesting.
700 1 _aMarciniak, Wiesław.
700 1 _aPrzewłocki, Henryk M.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK