000 03050cam a22004337i 4500
999 _c806
_d806
001 17756917
005 20170918092316.0
008 130530s2013 ne a b 001 0 eng d
010 _a 2013941676
016 7 _a016315512
_2Uk
020 _a9780124095014
020 _a0124095011
035 _a(OCoLC)ocn828670761
040 _aYDXCP
_beng
_cYDXCP
_erda
_dBTCTA
_dUKMGB
_dNLE
_dCDX
_dOCLCF
_dIXA
_dVGM
_dOCLCQ
_dOCLCO
_dOCLCQ
_dN5L
_dDLC
042 _alccopycat
050 0 0 _aTK5102.9
_b.B713 2013
082 0 4 _a620.0011
_223
100 1 _aBrainina, Irina S.,
_eauthor.
245 1 0 _aApplications of random process excursion analysis /
_cIrina S. Brainina, Povolzhye State University of Telecommunications and Informatics (PSUTI), Russia ; translated by Dmitri Arch.
250 _a1st ed.
260 _aOxford ;
_bElsevier,
_c©2013
264 1 _aAmsterdam ;
_aBoston ;
_aHeidelberg ;
_aLondon ;
_aNew York ;
_aOxford ;
_aParis ;
_aSan Diego ;
_aSan Francisco ;
_aSingapore ;
_aSydney ;
_aTokyo :
_bElsevier,
_c[2013]
264 4 _c©2013
300 _axvii, 233 pages :
_billustrations ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
490 1 _aElsevier insights
504 _aIncludes bibliographical references (pages 227-233) and index.
520 _aThis book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics. Introduces English-speaking students and researchers in to the results obtained in the former Soviet/ Russian academic institutions within last few decades. Supplies a range of applications suitable for all levels from undergraduate to professional. Contains computer simulations. --
650 0 _aSignal processing
_xMathematics.
650 7 _aSignal processing
_xMathematics.
_2fast
830 0 _aElsevier insights.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy1606/2013941676-d.html
906 _a7
_bcbc
_ccopycat
_d2
_encip
_f20
_gy-gencatlg
942 _2ddc
_cBK